Veuillez utiliser cette adresse pour citer ce document : http://dspace1.univ-tlemcen.dz/handle/112/1604
Affichage complet
Élément Dublin CoreValeurLangue
dc.contributor.authorSAYAH, C.-
dc.contributor.authorBOUAZZA, B.-
dc.contributor.authorGUEN-BOUAZZA, A.-
dc.contributor.authorCHABANE-SARI, N.E.-
dc.date.accessioned2013-03-18T10:37:43Z-
dc.date.available2013-03-18T10:37:43Z-
dc.date.issued2012-
dc.identifier.issn2248-9622-
dc.identifier.urihttp://dspace.univ-tlemcen.dz/handle/112/1604-
dc.descriptionJournal of Engineering Research and Applications (IJERA).Vol. 2, Issue 1,Jan-Feb 2012, pp.476-482.en_US
dc.description.abstractAmong the group-III nitrides, InN displays markedly unusual electronic transport characteristics due to its smaller effective mass, high peak velocity and high background electron concentration. We present the steady-state, velocity-field characteristics of wurtzite indium nitride, determined using an ensemble Monte Carlo approach. A three valley model for the conduction band is employed and ionized impurity, polar and non polar optical phonon, acoustic deformation potential, piezoelectric, deformation potential and intervalley scattering mechanisms are considered. The sensitivity of these steady-state results to variations in temperature and doping concentration is examined. Our results suggest that the transport characteristics of indium nitride are superior to those of gallium nitride and gallium arsenide, over a wide range of temperatures, from 77 to 600 k, and doping concentrations, up to 1.0*1019 cm-3 .Hence, indium nitride has considerable potential for device applications.en_US
dc.language.isoenen_US
dc.subjectMonte Carlo methoden_US
dc.subjectsemiconductor materialsen_US
dc.subjectwide bandgap semiconductorsen_US
dc.titleMonte Carlo Simulation of Electron Transport in wurtzite Indium Nitrideen_US
dc.typeArticleen_US
Collection(s) :Articles internationaux

Fichier(s) constituant ce document :
Fichier Description TailleFormat 
Monte-Carlo-Simulation-of-Electron-Transport-in-wurtzite.pdf921,19 kBAdobe PDFVoir/Ouvrir


Tous les documents dans DSpace sont protégés par copyright, avec tous droits réservés.